1. Lara Lobo, Beatriz Fernandez, Rosario Pereiro, Nerea Bordel, Evgeny Demenev, Damiano Giubertoni, Massimo Bersani, Philipp Hoenicke, Burkhard Beckhoff, A. Sanz-Medel,
    Quantitative depth profiling of boron and arsenic ultra low energy implants by pulsed rf-GD-ToFMS,
    in «JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY»,
    vol. 26,
    2011
    , pp. 542-
    549
  2. E. Demenev, D. Giubertoni, J. van den Berg, M. Reading, M. Bersani,
    Calibration correction of ultra low energy SIMS profiles based on MEIS analyses for arsenic shallow implants in silicon,
    in «NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS»,
    vol. xxx,
    2011
  3. Erica Iacob, Mario Barozzi, Evgeny Demenev, Salvatore Gennaro, Damiano Giubertoni, Massimo Bersani,
    Development of nano-roughness under SIMS ion sputtering of Germanium surfaces,
    SIMS XVIII,
    Riva del Garda, Italia,
    18-23/09/2011
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