Material Analysis
The Material Analysis Group in the Research Unit New Materials and Analytical Methods for Biosensors and Bioelectronics runs a state of the art Analytical Laboratory including:
| dynamic Secondary Ion Mass Spectrometry (SIMS) | SIMS.pdf |
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| Time of Flight Secondary Ion Mass Spectrometry (ToF - SIMS) | tof.pdf |
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| X-Ray Photoelectron Spectroscopy (XPS) | XPS.pdf |
| Atomic Force Microscopy (AFM) | AFM.pdf |
| Scanning Electron Microscopy (SEM) | |
| Total Reflection X-Ray Fluorescence (TXRF) | |
The group is mainly dedicated to surface analysis in the field of microelectronics/nanotechnology and organic/bio surfaces.
The equipment is used for servicing in-house research of the Fondazione Bruno Kessler as well as Industry and Research Labs worldwide but also for the research activities proper of the group.
The group coordinates the European Project ANNA , a consortium of analytical laboratories offering support to the microelectronic and nanotechnology industry and academic research of the European Union.
